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論文名稱 Title |
複數近場量測系統之實現與應用 Implementation and Application of Complex Near-Field Measurement System |
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系所名稱 Department |
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畢業學年期 Year, semester |
語文別 Language |
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學位類別 Degree |
頁數 Number of pages |
93 |
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研究生 Author |
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指導教授 Advisor |
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召集委員 Convenor |
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口試委員 Advisory Committee |
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口試日期 Date of Exam |
2013-07-04 |
繳交日期 Date of Submission |
2013-07-15 |
關鍵字 Keywords |
相位校正、磁場探針、近場量測、向量網路分析儀、複數近場、遠場、天線 phase calibration, magnetic probe, near-field measurement, vector network analyzer, Complex near field, far field, antenna |
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統計 Statistics |
本論文已被瀏覽 5844 次,被下載 875 次 The thesis/dissertation has been browsed 5844 times, has been downloaded 875 times. |
中文摘要 |
本論文實現複數近場量測系統與探討其應用。電磁放射體依距離可分為近場與遠場,放射場可以由空間向量組成,每一點位置的訊號皆為複數訊號,複數訊號由振幅及相位組成,即為複數近場。首先建立複數近場量測架構,說明近場量測根據取樣點形成分為三種量測方式且詳細描述其自動化流程,記錄近場振幅及相位資訊的步驟。而後根據IEC 61967-6之附錄A:微帶線法進行磁場探針振幅校正;使用短路時間法或鏈路補償法進行相位的校正,探討系統靈敏度對磁場探針量測結果的影響。接著利用雙端阻抗匹配之50歐姆微帶線驗證複數近場量測系統與有限元素法電磁模擬間結果之符合度及分析其誤差。最後進行矩形微帶天線之複數近磁場量測,利用天線之近場檢測結果分析其製作上的物理尺寸缺陷及不對稱,探討對遠場場型之影響與變化。本論文之複數近場量測系統相較傳統近場量測系統不僅擁有量測振幅的能力,還同時得到相位資訊,取得複數近場資訊可以運用在許多不同領域上,量測能夠達到省時快速、低維護成本、使用空間小等優點。 |
Abstract |
This thesis focuses on the implementation and potential applications of a complex near-field measurement system. The study starts with a brief overview on the near-field measurement methods and describes further details regarding their specific architecture and research direction. In this work, the complex near-field measurement is taken with the help of an automatic scanner. The magnetic probes that are used as sensing devices require calibration prior to a complex magnetic-field measurement. The amplitude calibration is performed based on the microstrip-line method in IEC 61967-6 standard, while the phase calibration is done by either a short-inductance or through-delay compensation method. Measured results for a terminated 50-ohm microstrip line and a rectangular microstrip patch antenna are verified by full-wave simulations. Furthermore, the complex magnetic near-field measurement results for the antenna can be used to predict the influence of manufacturing defects on the far-field radiation pattern. The advantages of the proposed near-field measurement system are time saving, low cost and small space. |
目次 Table of Contents |
論文審定書 .................................................................................................................... i 誌謝............................................................................................................................... ii 摘要.............................................................................................................................. iii Abstract ........................................................................................................................ iv 目錄............................................................................................................................... v 圖目錄 ......................................................................................................................... vii 表目錄 ......................................................................................................................... xii 第一章 緒論 ............................................................................................................... 1 1.1 研究背景與技術現況 ................................................................................... 1 1.2 動機目標及技術應用 ................................................................................... 4 1.3 基礎定義 ....................................................................................................... 7 1.3.1 近場與遠場範圍 ................................................................................. 7 1.3.2 空間向量與複數訊號 ......................................................................... 9 1.4 論文章節 ..................................................................................................... 12 第二章 複數近場量測系統及磁場探針校正 ......................................................... 13 2.1 複數近場量測系統 ..................................................................................... 13 2.1.1 系統介紹 ........................................................................................... 14 2.1.2 量測方式 ........................................................................................... 18 2.1.3 自動化流程 ....................................................................................... 21 2.2 磁場探針校正 ............................................................................................. 23 2.2.1 振幅校正 ........................................................................................... 23 2.2.2 相位校正 ........................................................................................... 30 2.3 系統靈敏度 ................................................................................................. 33 第三章 複數近磁場量測與模擬驗證 ..................................................................... 35 3.1 50 Ω 微帶線之複數近磁場量測與模擬驗證 ............................................ 35 3.1.1 散射參數驗證 ................................................................................... 35 3.1.2 複數近磁場驗證 ............................................................................... 36 3.1.3 誤差分析 ........................................................................................... 48 3.2 矩形微帶天線之複數近磁場量測與模擬驗證 ......................................... 50 3.2.1 散射參數驗證 ................................................................................... 50 3.2.2 複數近磁場驗證 ............................................................................... 51 3.2.3 誤差分析 ........................................................................................... 60 3.2.4 天線近場檢測與遠場相關性分析 ................................................... 62 第四章 結論 ............................................................................................................. 67 參考文獻 ..................................................................................................................... 68 附錄一 正規化分析 ................................................................................................. 74 附錄二 近遠場轉換方法 ......................................................................................... 78 |
參考文獻 References |
[1] J. M. Redouté and M. Steyaert, EMC of Analog Integrated Circuits. New York, NY: Springer, 2009. [2] T. Sudo, H. Sasaki, N. Masuda and J. L. Drewniak, “Electromagnetic interference (EMI) of system-on-package (SOP),” IEEE Trans. Adv. Packag., vol. 27, no. 2, pp. 304-314, May 2004. [3] 林明星、許崇宜、林漢年、邱政男、陳居毓、吳俊德、何子儀、謝翰璋、王曉謙,電磁相容理論與實務,全華圖書,民國九十六年 [4] 陳秋國、董建利、袁世一,積體電路近場掃描自動量測系統開發與量測,經濟部標準檢驗局專題研究報告,民國九十七年 [5] K. S. Chen, T. S. Horng, C. Y. Ho, J. M. Wu and K. C. Peng, “Diagnosis of EMI to laptop WWAN device from TFT-LCD driver using non-contact measurement-based transfer function technique,” in IEEE Int. Electromagn. Compat. Symp., July 2010, pp. 301-304. [6] M. Wang, K. Haddadi, D. Glay and T. Lasri, “Compact near-field microwave microscope based on the multi-port technique,”in Proc. European Microw. Conf., Sep. 2010, pp. 771-774. [7] K. Yang et al., “Electrooptic mapping and finite-element modeling of the near-field pattern of a microstrip patch antenna,” IEEE Trans. Microw. Theory Tech., vol. 48, no. 2, pp. 288-294, Feb. 2000. [8] R. A. Kleismit, M. K. Kazimierczuk and G. Kozlowski, “Sensitivity and resolution of evanescent microwave microscope,” IEEE Trans. Microw. Theory Tech., vol. 54, no. 2, pp. 639-647, Feb. 2006. [9] V. V. Talanov and A. R. Schwartz, “Near-field scanning microwave microscope for interline capacitance characterization of nanoelectronics interconnect,” IEEE Trans. Microw. Theory Tech., vol. 57, no. 5, pp. 1224-1229, May 2009. [10] F. Andre, A. P. Tran, N. Mourmeaux and S. Lambot, “Integrated modeling of near-field ground-penetrating radar and electromagnetic induction data for reconstructing multilayered media,”in Proc. Int. Conf. Ground Penetrating Radar, June 2012, pp. 411-416. [11] A. C. Kak and M. S. Slaney, Principles of Computerized Tomographic Imaging. New York, NY: IEEE Press, 1999. [12] K. J. Nicholson and C. H. Wang, “Improved near-field radar cross-section measurement technique,” IEEE Antennas Wireless Propag. Lett., vol. 8, pp. 1103-1106, Oct. 2009. [13] T. Vaupel and T. F. Eibert, “Comparison and application of near-field ISAR imaging techniques for far-field radar cross section determination,” IEEE Trans. Antennas Propag., vol. 54, no. 1, pp. 144-151, Jan. 2006. [14] A. Broquetas, J. Palau, L. Jofre and A. Cardama, “Spherical wave near-field imaging and radar cross-section measurement,” IEEE Trans. Antennas Propag., vol. 46, no. 5, pp. 730-735, May 1998. [15] R. L. Olmon et al., “Determination of electric-field, magnetic-field, and electric-current distributions of infrared optical antennas: a near-field optical vector network analyzer,” Phys. Rev. Lett., vol. 105, no. 16, May 2010. [16] M. A. Seo et al., “Fourier-transform terahertz near-field imaging of one-dimensional slit arrays: mapping of electric-field, magnetic-field, and Poynting vectors,” Optics Express, vol. 15, no. 19, pp. 11781-11789, Sep. 2007. [17] D. Baudry et al., “Plane wave spectrum theory applied to near-field measurements for electromagnetic compatibility investigations,” IET Science, Measurement and Technology, vol. 3, no. 1, pp. 72-83, Jan. 2009. [18] T. B. Hansen and A. D. Yagbjian, Plane-Wave Theory of Time-Domain Fields. Piscataway, NJ: IEEE Press, 1999. [19] Z. Yu et al., “Near-Field H to E transformation using plane wave spectrum theory,”in IEEE Int. Electromagn. Compat. Symp. Dig., Aug. 2011, pp. 542-546. [20] R. S. Elliott, Antenna Theory and Design. Upper Saddle River, NJ: Prentice Hall, 1981. [21] C. A Balanis, Advanced Engineering Electromagnetics. New York, NY: John Wiley & Sons, 1989. [22] J. Shi et al., “Using near-field scanning to predict radiated fields,” in IEEE Int. Electromagn. Compat. Symp. Dig., Aug. 2004, pp. 14-18. [23] J. Shi, M. A. Cracraft, K. P. Slattery, M. Yamaguchi and R. E. DuBroff, “Calibration and compensation of near-field scan measurements,” IEEE Trans. Electromagn. Compat., vol. 47, no. 3, pp. 642-650, Aug . 2005. [24] T. K. Sarkar and A. Taaghol, “Near-field to near/far-field transformation for arbitrary near-field geometry utilizing an equivalent electric current and MoM,” IEEE Trans. Electromagn. Compat., vol. 47, no. 3, pp. 566-573, Mar. 1999. [25] Y. Vives-Gilabert et al., “Modeling magnetic radiations of electronic circuits using near-field scanning method,” IEEE Trans. Electromagn. Compat., vol. 49, no. 2 pp. 391-400, May 2007. [26] J. Stenarson, K. Yhland and C. Wingqvist, “An in-circuit noncontacting measurement method for S-parameters and power in planar circuits,” IEEE Trans. Microw. Theory Tech., vol. 49, no. 12, pp. 2567-2572, Dec. 2001. [27] T. Zelder, H. Rabe and H. Eul, “Contactless electromagnetic measuring system using conventional calibration algorithms to determine scattering parameters,” Adv. Radio Sci., vol. 2, pp. 73-76, June 2007. [28] T. Zelder, B. Geck, M. Wollitzer, I. Rolfes and H. Eul,“Contactless vector network analysis with printed loop couplers,” IEEE Trans. Microw. Theory Tech., vol. 56, no. 11, pp. 2628-2634, Nov. 2008. [29] R. A. Speciale, “Computer-Simulation of near-field phased-array radiation-pattern Scanning,” in Antennas and Propagation Society Int. Symp. Dig., June 2007, pp.1625-1628. [30] B. Yan, S. A. Saoudy and B. P. Sinha, “A low cost planar near-field/far-field antenna measurement system,” in Antennas and Propagation Society Int. Symp. Dig., July 1997, pp. 152-155. [31] E. T. Rahardjo, F. Y. Zulkifli, M. D. Firmansah and C. Apriono,“Developments low cost probe compensated cylindrical near field measurement for antenna radiation wave,” in Electromagnetics Research Symp., Mar. 2011, pp. 561-564. [32] T. Brockett and Y. Rahmat-Samii, “A bipolar planar near-field measurement system for compact millimeter-wave antenna arrays,” in Proc. IEEE Int. Symp. Phased Array Systems and Technology, Oct. 2010, pp. 292-297. [33] R. A. Speciale “Computing the Scattering Matrix of Multiport Systems,” in Electromagnetics Research Symp. Dig., June 2004, pp. 515-518. [34] D. Slater, Near-Field Antenna Measurements. Norwood, MA: Artech House, 1991. [35] P. Petre and T. K. Sarkar, “Planar near-field to far-field transformation using an equivalent magnetic current approach,” IEEE Trans. Antennas Propag., vol. 40, no. 11, pp. 1348-1355, Nov. 1992. [36] A. Taaghol and T. K. Sarkar, “Near-field to near/far-field transformation for arbitrary near-field geometry utilizing an equivalent magnetic current,” IEEE Trans. Electromagn. Compat., vol. 38, no. 3, pp. 536-542, Aug. 1996. [37] P. Petre and T. K. Sarkar, “Planar near-field to far-field transformation using an array of dipole probes,” IEEE Trans. Antennas Propagat., vol. 42, no. 4, pp. 534-537, Apr. 1994. [38] C. A. Balanis, Antenna Theory: Analysis and Design, 3rd ed. Hoboken, NJ: John Wiley & Sons, 2005. [39] 陳俊儀,平面近場量測系統之研究與建立,國立中央大學電機工程所碩士論文,民國九十二年 [40] T. B. A. Senior, Mathematical Methods in Electrical Engineering. New York, NY: Cambridge University Press, 1986. [41] 謝昕峯,基於近場量測技術之晶片層級電磁干擾研究,國立中山大學電機工程學系碩士論文,民國一百零一年 [42] Integrated Circuits-Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz-Part 6:Measurement of Conducted Emissions-Magnetic Probe Method, IEC Standard 61967-6, 2002. [43] Y. Rahmat-Samii, L. I. Williams and R. G. Yaccarino, “The UCLA bi-polar planar-near-field antenna measurement and diagnostics range,” IEEE Antennas Propag. Mag., vol. 37, pp. 16-35, Dec. 1995. [44] M. T. Ghasr et al., “Rapid rotary scanner and portable coherent wideband Q-band tansceiver for high-resolution millimeter wave imaging applications,” IEEE Trans. Instrumentation and Measurement, vol. 60, no. 1, pp. 186-197, Jan. 2011. [45] 陳棓煌,向量網路分析儀量測校正方法之研究與實踐,國立中山大學電機工程學系碩士論文,民國八十五年 [46] 蔡第奇,平衡式元件之向量網路分析儀量測技術,國立中山大學電機工程學系碩士論文,民國九十一年 [47] S. A. Wartenberg, RF Measurements of Die and Packages. Norwood, MA: Artech House, 2002. [48] ZX60-272LN+ Coaxial Low Noise Amplifier, Mini-Circuits, Brooklyn, NY, Oct. 2012. [49] D3I2040 2.0 - 4.0GHz SMA Isolator, DiTom Microwave, San Jose, CA. [50] ZX60-33LN+ Coaxial Low Noise Amplifier, Mini-Circuits, Brooklyn, NY, Aug. 2009. [51] J. S. Chen and K. L. Wong, “A single-layer dual-frequency rectangular microstrip patch antenna using a single probe feed, ” Microwave Opt. Technol. Lett., vol. 11, pp.83 -84, Feb. 1996. [52] J.-J. Laurin, J.-F. Zurcher and F. E. Gardiol, "Near-field diagnostics of small printed antennas using the equivalent magnetic current approach," IEEE Trans. Antennas Propagat., vol. 49, no. 5, pp. 814-828, Aug. 2001. [53] B. Nadeau and J.-J. Laurin, “Extrapolations using vectorial planar nearfield measurements for EMC,” in Proc. IEEE Int. Symp. Electromag. Compat., Aug. 1998, pp. 924-928 |
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