本實驗主要研究鈦鋯酸鉛 (Pb(Zr0.52Ti0.48)O3) 於相圖中MPB 之組成，經由解析不同形貌之晶域判定所屬晶相。實驗中藉由X-ray 繞射分析儀鑑定燒結前後晶相之結果為正方晶相 (tetragonal)。並利用掃描式電子顯微鏡 (SEM) 觀察晶域之表面形態。而藉由穿透式電子顯微鏡 (TEM) 觀察晶域條紋之亮暗對比發現 α-晶界、δ-晶界及 π-晶界的產生。並利用擇區繞射圖譜 (SADP) 觀察90o 晶域壁為 {011)、180o 晶域壁為 {100) 及 {220)。最後經由對比分析90o 晶域之位移向量 R = ε[011]、180o 晶域之位移向量 R = n[001]。不同形貌晶域之晶相則是利用收斂束電子繞射 (CBED) 解析，結果顯示藉由檢視 Z = [100], [110], [111] 之對稱性，90o 晶域 (δ-晶界) 及 π-晶界皆為正方晶相。

The composition dependent variation of ferroelectric domain structure in lead zirconate titanate (Pb(Zr0.52Ti0.48)O3) ceramics have been investigated within the morphotropic phase boundary (MPB). Tetragonal phase in sintered samples were identified via X-ray diffractometry (XRD). Representative microstructures of ferroelectric domains were examined using scanning electron microscopy (SEM). α-boundaries, δ- boundaries, and π-boundaries were analyzed from the contrast of extreme fringe patterns by transmission electron microscopy (TEM). Twin planes for 90o domains lie in {011) and for 180o domains lie in {100) and {220) were determined by selected area diffraction patterns (SADP). Traditional contrast analysis was adopted for determining displacement vectors (R). 90o domains with R = ε[011] and 180o domains with R = n[001]. Convergent beam electron diffraction (CBED) was performed to identify crystalline phases of different domain configurations. By examined the symmetry along the Z = [100], [110], and [111] zone axis, both δ-boundaries and π-boundaries are tetragonal phase.

Abstract I
摘要 II
目錄 III
表目錄 VII
圖目錄 VIII
第一章 前言 1
第二章 理論及文獻回顧 3
2.1 壓電性 (piezoelectricity) 3
2.2 強電性 (ferroelectricity) 5
2.3 鈦鋯酸鉛之晶體結構 8
2.3.1 鈣鈦礦 (perovskite) 結構 8
2.3.2 鈦鋯酸鉛之B陽離子位置 9
2.3.3 不同晶相之結構 11
2.4 鈦鋯酸鉛之相圖 13
2.4.1 相圖介紹 13
2.4.2 相變化對於極化之影響 18
2.5 鈦鋯酸鉛之雙晶 (twinning) 19
2.5.1 雙晶的種類 19
2.5.2 強電性-強彈性雙晶 (ferroelectric-ferroelastic twinning) 20
2.5.3 正方相晶域 (tetragonal domains) 21
2.5.4 菱方相晶域 (rhombohedral domains) 25
2.5.5 MPB 之晶域 25
2.6 晶域壁之條紋對比 27
2.6.1 α-晶界 (α-boundaries) 27
2.6.2 δ-晶界 (δ-boundaries) 28
2.6.3 π-晶界 (π-boundaries) 30
第三章 實驗流程 33
3.1 PZT 試片製備 33
3.1.1 原始粉末 33
3.1.2 試片製程 33
3.2 密度量測 39
3.3 結晶相鑑定 40
3.3.1 X-ray 繞射分析儀 40
3.3.2 晶格常數的量測 40
3.3.3 混合相的解析 41
3.4 顯微組織分析 41
3.4.1 掃描式電子顯微鏡 41
3.4.2 背向散射電子繞射分析 43
3.4.3 穿透式電子顯微鏡 43
第四章 實驗結果 45
4.1 結晶相鑑定 45
4.2 顯微組織分析 53
4.3 晶域之晶向關係 59
4.4 晶域微結構的觀察 61
4.4.1 PZT 燒結二十四小時之晶域微結構 61
4.4.2 90o 晶域 63
4.4.3 180o 晶域 66
4.4.4 π-晶界 71
4.4.5 PZT 燒結二小時之晶域微結構 78
第五章 討論 82
5.1 結晶相鑑定 82
5.2 強電性晶域 85
5.3 π-晶界 86
5.4 奈米晶域 89
第六章 結論 91
第七章 未來工作 92
第八章 參考文獻 93
附錄 100

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